Component Testers

Capacitance standard frame for 1–4 AH 11A standards, selectable values 0.1–115 pF, stability

Fused-silica capacitance standard with user-selectable values up to 115 pF, very high long-term stability, extremely low loss and NIST-traceable calibration.

1 kHz automatic measurement, accuracy 5 ppm, resolution 0.5 aF, extremely low loss down to 1.5×10⁻⁸ tan δ, three-terminal BNC and GPIB/RS-232.

50 Hz–20 kHz measurement range, extremely low loss down to 1.5×10⁻⁸ tan δ, fast measurements from 30 ms, three-terminal BNC, auto-ranging and GPIB/serial interface.

0.01% accuracy, 0.1 μΩ–100 MΩ range, low-power mode, 4-wire connections, up to 20 ms measurement, bin sorting and USB/RS232/LAN interfaces.

0.1% accuracy, L/C/R/Z measurement up to 100 kHz, 4-terminal mode, auto-ranging, tolerance sorting, Min/Max/Avg, USB logging and SCPI support.

0.05% impedance accuracy, L/C/R/Z measurement 20 Hz–300 kHz, selectable test levels, sweep up to 300 points, binning and USB/GPIB/LAN control.

0.05% accuracy, 20 Hz–500 kHz test frequency, AC 5 mV–2 V, DC bias ±5 V, 13 ms measurement, ALC, BIN sorting, list sweep and USB/RS232/LAN.

0.05% accuracy, 20 Hz–1 MHz test frequency, AC 5 mV–2 V, DC bias ±5 V, 13 ms measurement, ALC, BIN sorting, list sweep and USB/RS232/LAN/GPIB.

0.1% accuracy, test frequencies 60 Hz–30 MHz, 7 ms measurement, three output impedances, and support for sorting, zeroing and RS-232/USB interfaces.

0.3% accuracy, 1–650/800 V DC source, 0.001 µA–20 mA leakage current test, IR measurement, diode/Zener test, surge testing and RS-232 with optional GPIB.

Tests leakage current and insulation resistance up to 1 kV DC with PD detection, V/I waveform logging, automatic test sequence and USB/Ethernet interface.

0.001 mΩ–1.9999 MΩ range, DC/pulse/dry circuit test, 0.05% accuracy, temperature compensation, 4-channel R-scanning and RS232 interface.

Up to 6 kV pulse, 200 MHz sampling, eight test modes, support for BDV mode, as well as LAN/USB/RS232 and multi-channel testing for up to 25 cells.

0.05% impedance accuracy, 10 Hz–10 MHz test frequency, ±0.03° phase measurement, DC bias up to 40 V, advanced analysis, binning, logging and RS232/USB/LAN.

1-channel SMU models with two- or four-quadrant architecture, up to 60 W source/sink power, fast load recovery < 30 µs and data acquisition up to 500 kS/s.

0.2% basic accuracy, 10 kHz test frequency, 20 measurements/s, 5-digit display of L/C/R/Q or D, binning, limit values and RS-232 with optional GPIB.

0.05% basic accuracy, 5-digit display, test frequencies up to 100 kHz, 20 measurements/s, binning, limit values and RS-232 with optional GPIB.