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PicoScope 9341-30 PC Oscilloscope

4-channel PC oscilloscope with 30 GHz bandwidth, 16-bit resolution, and 15 TS/s sampling rate, optimized for CDR and optical-to-electrical signal analysis.


2-channel models

  • PicoScope 9301-20 – 2-channel / 20 GHz / 12-bit / 1 TS/s
  • PicoScope 9301-30 – 2-channel / 30 GHz / 12-bit / 1 TS/s
  • PicoScope 9302-20 – 2-channel / 20 GHz / 12-bit / 1 TS/s
  • PicoScope 9311-20 – 2-channel / 20 GHz / 12-bit / 1 TS/s

 

4-channel models

  • PicoScope 9321-20 – 4-channel / 20 GHz / 12-bit / 1 TS/s
  • PicoScope 9341-20 – 4-channel / 20 GHz / 12-bit / 1 TS/s
  • PicoScope 9341-30 – 4-channel / 30 GHz / 12-bit / 1 TS/s

 

Specifications

  • 2 or 4 high-speed analog channels
  • Bandwidth up to 30 GHz
  • 12-bit vertical resolution
  • Sampling rate up to 1 TS/s
  • Optical-to-electrical conversion for CDR
  • TDR/TDT outputs for measurements up to 7 V and 60 ps
  • Advanced CDR and SXRTO functionality
  • Mask limit testing and eye-diagram analysis
  • Support for simultaneous sampling on all channels
  • Windows-based software with intuitive interface

 

Applications

  • High-speed mixed-signal analysis
  • Eye-diagram and clock/data verification
  • Pulse and step transient measurements
  • Serial data verification up to 16 Gb/s
  • High-performance testing in electronics and communications systems
  • Troubleshooting and verification of high-speed systems

 

The PicoScope 9300 series are SXRTO (sampler-extended real-time) PC oscilloscopes with up to four high-speed channels, designed for analysis of extreme transitions, high-speed pulses, and CDR signals. The series offers bandwidth up to 30 GHz, sampling rates up to 1 TS/s, and 12-bit vertical resolution for precise analysis of fast and high-frequency signals. The instruments include optical-to-electrical conversion, advanced CDR and SXRTO functionality, as well as eye-diagram and mask testing. The PicoScope 9300 series is used for high-speed mixed-signal analysis, verification of digital communication channels, troubleshooting of complex systems, and integration into high-speed test environments.

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