The SFT 2400 with integrated coupling network simulates electrical fast transient (EFT) as defined in IEC 61000-4-4 and EN 61000-4-4 standards.
Due to the very short rise time of 5ns, the individual pulses generate a broadband RF spectrum up to 300 MHz.
The simple operation takes place via a capacitive color touch display.
All parameters are clearly displayed without nested menus and can be changed quickly by tapping and using a digital rotary encoder.
The normative test levels 1, 2, 3 and 4 are preprogrammed, additional test sequences can be stored via the memory function.
The SFT 2400 also offers a variety of special features such as "Real Burst", which simulates the natural appearance of the burst pulse or "noise" which simulates contact bouncing.
The functions "IFM" and "DFM" (increasing or decreasing frequency) are important tools for examining resonance or saturation effects in the device under test.
IEC / EN 6100-4-4
The SFT 2400 with integrated coupling network simulates electrical fast transient (EFT) as defined in IEC 61000-4-4 standards.
Due to very short rise time of 5ns, the individual pulses generate a broadband RF spectrum uo to 300 MHz.
The simple operation takes place via a capacitive color touch display.
All parameters are clearly displayed without nested menus and can be changed quickly by tapping and using a digital rotary encoder.
The normative test levels 1, 2, 3 and 4 are programmed, additional test seuences can be stored via the memory function.
Performance features:
All burst parameters can be changed during a burst test. This guarantees that it can be easily and continuously to detect the fault threshold of the specimen. An interruption of the test for a parameter change at the burst generator is not necessary.
The pulse burst occuring in pratice does not comply with the definition of the standard. Its physical properties are deviating against the standard definition. The generator SFT 2400 provides the user a variety of special features such as "Real Burst", which simulates the natural appearence of the Burst pulse or "Noise" can be simulated with the contact bounce.
To localisation of faults, it is possible to couple the burst pulse very accurately to a certain process time of the EUT. The burst pulse microsecond exactly triggered with a jitter of <25ns.
